Pan+Dough Probe provides accurate, repeatable data for baking applications. Its stationary vertical probe that is always at a fixed penetration depth, unlike probes inserted into the loaf that can change position as the dough rises. The probe yields measurements at the same reference point from batch to batch. It is placed under the bread or bun dough and simultaneously captures the pan/dough interface temperature and the dough core temperature, and it connects to a temperature interface device.
These readings are used to produce the Bake Cycle S Curve, indicating critical temperature points for yeast kill, gelatinization and arrival time as they relate to the percentage of travel through the baking chamber. Scorpion Software Version 8 (SV8) automatically calculates the three S Curve data points. Environment temperature also is measurable using sensors connected to the temperature interface device.
Reading Thermal, Reading Bakery Systems